The Corning® Tropel® FlatMaster® MSP 300 (Multi-Surface Profiler) Fully Automatic Wafer is a fully automatic frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface. Take a look at how this analytics instrument provide robust metrology for a variety of applications.
