Grazing Incidence X-ray diffraction with the Aeris diffractometer

Unlock the full potential of X-ray diffraction (XRD) with Aeris, a compact diffractometer that enables advanced Grazing Incidence X-ray Diffraction (GIXRD) analysis. This powerful technique allows for the characterization of thin layers and thin films on various substrates, including glass. By leveraging the capabilities of GIXRD, researchers can gain valuable insights into the structural properties of materials, which is crucial for a wide range of applications. In this video, Nicholas Norberg explores the benefits of combining Aeris with GIXRD, including the ability to perform preFIX and Bragg-Brentano measurements with ease. With Malvern Panalytical's expertise in X-ray diffractometry, you'll discover how to unlock new possibilities in materials characterization. Learn more about the capabilities of Aeris and how it can elevate your research to the next level. Also follow us on: https://www.instagram.com/malvernpanalytical/ https://www.linkedin.com/company/malvernpanalytical