Heating TEM experiment: Transfer - Overview

Transfer of Focus Ion beam (FIB) lamella for in-situ heating transmission electron microscopy (TEM) experiment. A Protochips fusion chip (https://www.protochips.com/products/fusion/) is used for heating TEM experiment. The procedure details the preparation of the chip and transfer of the FIB lamella. All steps : https://www.youtube.com/watch?v=z3z4efyMpio&list=PLgA8-PcNho1YODXegQjaQM-NoD4GeGT0h