For efficient testing of thousands of μLEDs on a wafer, the test procedure must be parallelized. The manufacturer is thus required to simultaneously contact as many μLEDs as possible. In addition, the optical inspection should be fast and accurate, and performed synchronous to the production flow. This functions only with a 2D measurement using specifically calibrated instruments to prevent measurement errors.
https://www.instrumentsystems.com/en/products/imaging-colorimeters/lumitop-2700-4000/
