Introduction to the NP-AFM from AFM Workshop. The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples, and routine scanning of technical samples such as wafers and disks or for nanotechnology research.. To learn more about how the NP-AFM fits your application needs, visit us at www.afmworkshop.com
