P&ID to iTwin: Accelerating the Digitalization of 2D Design Data Using Machine Learning

This session is part of the Connecting Data To iTwin track from the iTwin Developer Conference 2022. Making a digital twin can be a labor-intensive process. In this session, you will see how to accelerate digital twin creation using the Bentley iTwin platform’s Machine Learning capabilities. We will show how you can quickly and reliably extract P&ID (Piping and Instrumentation Diagram) design data from 2D, rasterized documents. Once this data is extracted, it can be dynamically queried by iTwin applications. Links to resources referenced in this video: P&ID to iTwin API https://developer.bentley.com/apis/pnid-to-itwin/ iTwin Platform Portal https://developer.bentley.com/ iTwin Community Support https://developer.bentley.com/support/