SEM part 04 -detectors

This is the advanced session of the SEM Scanning Electron Microscopy. This session is part of our program to put our training sessions online and in eleven clips we go through some tips and tricks and cover more detailed special topics. The machine used is a Tescan Maia 2016 outfitted with a Oxford EDS 50 detector. This part 4 contains: -Imaging cross sectional surfaces and the relevance of detector position -Facing the chamber SE for improved contrast -Grid voltage on the chamber SE for improved contrast -Position the BSE in offset position to improve contrast of porous samples Direct links to each clip and its topic: PT01: https://youtu.be/K_tunMLbVj4 -General discussion of the advance session -Sample preparation walk through PT02: https://youtu.be/SH6VwKdOwnc -Using low-vacuum mode for uncoated non-conducting samples -Insertion/remove of low-vac aperture in pole piece PT03: https://youtu.be/vRQ_Hax89Nw -Using voltage balancing to imagine uncoated non-conducting samples -Using plasma-cleaner for charge reeducation and its general usage PT04: https://youtu.be/6EMNfuoRsBw -Imaging cross sectional surfaces and the relevance of detector position -Facing the chamber SE for improved contrast -Grid voltage on the chamber SE for improved contrast -Position the BSE in offset position to improve contrast of porous samples PT05: https://youtu.be/y61CbsgWO7c -CORAL feature: photo correlation to SEM image -stigmatism correction at high resolution work -relevance of low voltage operations -discussions on BDM - Beam Deceleration Mode PT06: https://youtu.be/TT8Ca7w3Emc -STEM mode on the SEM -changing to STEM carousel -bright field, dark field, and HADF -EDS in STEM mode PT07: https://youtu.be/nfTlfvRvQns -General discussion on imaging colloidal particle suspensions -BSE detectors operations at low voltage -Mid-angle detector at its function PT08: https://youtu.be/UwCAy1luQ04 -Comparison of EDS lateral resolution with STEM approach -Issues with EDS operation at very low magnification PT09: https://youtu.be/b0cg4MtqLTs -low voltage vs high voltage comparison in imaging -low mag operations and how to circumvent view field limits -benefits of using high pixel sizes at low magnification -stitching of images for larger view field -usage of stitched panorama image as map in CORAL tool PT10: https://youtu.be/nA3QUV82K6c -Using EDS for automated particle detection -Correlation matrix of particle morphology and EDS data -Stitching in EDS particle detection for better statistics -Benefits of large working distance for better depth-of-field PT11: https://youtu.be/Qd83PBXdjQY -Using 3D stereoscopic imaging with the Alicona MAX software -General aftermath talk