Pre-fabrication Testing / Logic Verification, Corner Analysis, Design for Testability, Observability & Controllability, Stuck-At Faults, SSL Fault Detection, Multiple Stuck-Line (MSF) Faults, Test Pattern Generation, Bridging Faults, Stuck-Open Faults, Sequential Circuit Test Generation, AdHoc Design for Testability, Scan-Path Design, Static Glitch, Scan Design, Scannable Flip-flops, Built-in Self-test (BIST), Linear-feedback shift-register (LFSR), Single Bit signature register (MISR), Multiple-input signature register (MISR), BILBO
