Webinar: Combining 4D STEM and in-situ experiments

The advent of electron counting direct detectors and 4D STEM has shifted TEM analysis from a primarily qualitative tool to one capable of true, representative statistical analysis. By combining 4D STEM data collection and post-collection pattern noise reduction, tens of thousands of grains can be analyzed in relatively short time periods. When paired with in-situ experiments, this enables statistical quantification of how microstructure evolves in response to applied stimuli. In this webinar, we will discuss the combination of 4D STEM with quantitative in-situ TEM deformation experiments to explore the microstructural evolution of nanocrystalline and ultrafine grained thin films under applied loads. Specifically, we combine direct observations of grain boundary and dislocation-mediated plasticity with statistical analysis of over one hundred thousand grains to understand how microstructure conditions drive grain instability and localized plasticity and how this behavior dictates mechanical properties.