Why Intel’s Memory Chips Randomly Failed in 1978

Why Intel’s Memory Chips Randomly Failed in 1978 In 1978, Intel engineers discovered a bizarre problem inside their 16 kilobit DRAM chips. Memory bits were randomly changing from ones to zeros with no clear explanation. After a deep investigation, the shocking truth was uncovered: radioactive contamination inside the ceramic chip packaging. A manufacturing plant built near an old uranium mill introduced trace amounts of uranium and thorium into the materials used for semiconductor packaging. The alpha particles released by these radioactive atoms were powerful enough to strike the silicon memory cells and flip stored bits. This phenomenon later became known as a “soft error” — one of the most fascinating intersections of nuclear physics and computer engineering. Watch till the end to learn how invisible radiation changed the future of computer chip design forever. #Intel #DRAM #Radiation #ComputerHistory #Semiconductor #Technology #Engineering #Science #Microchips #Physics