Yield Explorer and SiliconDash -- Synopsys

April 12, 2021 -- Once a design goes to tape-out, the real challenges begin. Teams find themselves drowning in data from design-process-test during production ramp-up, and have to cope with data from numerous sources in different formats in the manufacturing test supply chain. In this episode of Chalk Talk, Amelia Dalton chats with Mark Laird of Synopsys in part three of our series on the Silicon LifeCycle Management (SLM) platform, discussing how Yield Explorer and SiliconDash give valuable insight to engineering and manufacturing teams. More information about the Synopsys Silicon Lifecycle Management Platform: https://bit.ly/3sb4KE9 Watch the first episode of this series called Silicon Lifecycle Management (SLM): https://youtu.be/Kv6f1wnc148 Watch the second episode of this series called In-Chip Sensing and PVT Monitoring: https://youtu.be/cMGDR_c8N2o