How to remove a sample using MiniTEM™ 1.0

MiniTEM is the innovation that puts the power of TEM technology in your hands. Rapid nanoparticle characterization. Meaningful data on particle morphology, size distribution and purity. Easy to use and place. MiniTEM - Saves time - Instant results – adjust your process within a few hours - No waiting for service supplier - Automation frees up your time for other tasks MiniTEM- Increases reliability - See your product and your process - Objective quantitative data - Confirm critical quality attributes MiniTEM - Makes it easier Less focus on the technology and more on the results Automation allows non-expert operation Minimized risk of human error Developed specifically for nanoparticle characterization Resolution of 1 nm Accelerating voltage 25kV The system can be plugged into a standard wall socket and can be placed in any standard laboratory setting – close to your process. Images and quantitative data on nanoparticles - Overall morphology and particle integrity - Particle size distribution - Purity - Particle clustering or aggregation Automated imaging and image analysis The automation aspect of MiniTEM provides automatic image acquisition and subsequent analysis and data presentation. Pattern recognition and machine learning capabilities enable MiniTEM to perform advanced particle characterization, classification and measurements. The results are statistically relevant thanks to the automatic acquisition and analysis of a large number of images. MiniTEM in process development MiniTEM complements existing routine analysis methods in process development. The system offers an in-house solution that enables non-experts in electron microscopy to rapidly obtain meaningful nanoparticle characterization data. It automatically images, detects and analyzes particles. In a few hours you generate quantitative data and images of your nanoparticles that can support decision making in the optimization of your process.